AFM, Atomic Force Microscopy Calibration
Scanning Probe Microscopy Calibration

AFM Gold Calibration Kit
AFM Gold Calibration Kit 		TipChecker for AFM Probes
TipChecker for AFM Probes 		HS series AFM calibration standard
HS-Series AFM Calibration Standards
and CS-XYZ AFM Calibration 		Highly Oriented Pyrolytic Graphite
Highly Oriented Pyrolytic
Graphite (HOPG)
High Resolution Calibration for AFM
High Resolution Calibration
Standards for AFM, SEM,
Auger, and FIB
70, 144, and 292nm pitch 		Very High Resolution Standard for AFM
Very High Resolution
Calibration Standard for AFM,
STM, Auger, FIB, and SEM
with 150nm and 300nm pitch 		waffle grating replica

2,160 Waffle Grating Replica
PELCO® AFM Tip and Resolution Test Specimen
Critical Dimension Calibration Specimen for AFM
Critical Dimension (CD)
Calibration Test Specimens
(may be used on AFM)
Multiple Use Microscopy
Calibration; AFM Profilometry
MRS-3, MRS-4, and MRS-5		 MetroChip Calibration Target
MetroChip Microscope
Calibration Target		 AFM Test Grating for X-, Y- and Z-direction

AFM Test Gratings